Accurate measurement of flux rate is essential in heavy-ion single event effects tests, but it presents significant challenges for monitoring low energy (5~10 MeV/u) and low intensity (less than 1E6 /s) heavy-ion beams. In this paper, we propose a novel detector that enables real-time monitoring of flux rate by simultaneously measuring the beam intensity and profile using secondary electrons on both the front and back surfaces of thin foils. The confinement of sec-ondary electrons through electric and magnetic fields is achieved, with CST simulation has been utilized to validate the method. This approach offers several ad-vantages over conventional methods, including high space and time resolution, reduced mass thickness, and multi-parameter measurement capability.